![]() ASTAR can generate diffraction pattern cross-correlation maps to highlight sample details like grain thickness variation, thickness of domain boundaries, grains overlapping and various 3-dimensional details.Keywords: Computer vision, Image processing, Image analysis, Transmission electron microscopy, Crystalline diffraction pattern, Selected area electron diffraction. ASTAR can generate virtual BF/DF images after acquisition with user defined aperture (disk, circle, line) and can use mask combination (addition /subtraction) onto the acquired ED patterns to highlight specific features. Selected Area Electron Diffraction (SAED) is a technique used alongside S/TEM to evaluate the sample’s crystallinity, lattice parameters, and crystal structure and orientation by evaluating the electron diffraction pattern created by the electron beam’s interaction with the sample atoms. The analysis of the results showed high agreement in considered cases, which let us assume that proposed algorithm has good development prospects.ASTAR ®️ (Patented device and technique) is an advanced tool that works in combination with precession electron diffraction (PED) device DigiSTAR to generate high spatial resolution orientation/phase maps ( 1-4 nm for FEG TEM, 1000 fps) using a number of high end direct electron detectors though a specific interface.
0 Comments
Leave a Reply. |